Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source

Aberration characterization of x-ray optics using multi-modal ptychography and a partially coherent source

Ptychography is a scanning coherent diffraction imaging technique that provides high-resolution imaging and complete spatial information of the complex probe and object transmission function. The wavefront error caused by aberrated optics has previously been recovered using ptychography when a highl...

पूर्ण विवरण

ग्रंथसूची विवरण
मुख्य लेखकों:	Moxham, TEJ, Laundy, D, Dhamgaye, V, Fox, OJL, Sawhney, K, Korsunsky, AM
स्वरूप:	Journal article
भाषा:	English
प्रकाशित:	American Institute of Physics 2021

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