High-fidelity quantum logic gates using trapped-ion hyperfine qubits

We demonstrate laser-driven two-qubit and single-qubit logic gates with fidelities 99.9(1)% and 99.9934(3)% respectively, significantly above the ≈ 99% minimum threshold level required for faulttolerant quantum computation, using qubits stored in hyperfine ground states of calcium-43 ions held in a...

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Main Authors: Ballance, C, Harty, T, Linke, N, Sepiol, M, Lucas, D
Format: Journal article
Published: American Physical Society 2016
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author Ballance, C
Harty, T
Linke, N
Sepiol, M
Lucas, D
author_facet Ballance, C
Harty, T
Linke, N
Sepiol, M
Lucas, D
author_sort Ballance, C
collection OXFORD
description We demonstrate laser-driven two-qubit and single-qubit logic gates with fidelities 99.9(1)% and 99.9934(3)% respectively, significantly above the ≈ 99% minimum threshold level required for faulttolerant quantum computation, using qubits stored in hyperfine ground states of calcium-43 ions held in a room-temperature trap. We study the speed/fidelity trade-off for the two-qubit gate, for gate times between 3.8 μs and 520 μs, and develop a theoretical error model which is consistent with the data and which allows us to identify the principal technical sources of infidelity.
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spelling oxford-uuid:3341be73-e6f7-40a7-b9d6-295d6f4242b22022-03-26T13:19:17ZHigh-fidelity quantum logic gates using trapped-ion hyperfine qubitsJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:3341be73-e6f7-40a7-b9d6-295d6f4242b2Symplectic Elements at OxfordAmerican Physical Society2016Ballance, CHarty, TLinke, NSepiol, MLucas, DWe demonstrate laser-driven two-qubit and single-qubit logic gates with fidelities 99.9(1)% and 99.9934(3)% respectively, significantly above the ≈ 99% minimum threshold level required for faulttolerant quantum computation, using qubits stored in hyperfine ground states of calcium-43 ions held in a room-temperature trap. We study the speed/fidelity trade-off for the two-qubit gate, for gate times between 3.8 μs and 520 μs, and develop a theoretical error model which is consistent with the data and which allows us to identify the principal technical sources of infidelity.
spellingShingle Ballance, C
Harty, T
Linke, N
Sepiol, M
Lucas, D
High-fidelity quantum logic gates using trapped-ion hyperfine qubits
title High-fidelity quantum logic gates using trapped-ion hyperfine qubits
title_full High-fidelity quantum logic gates using trapped-ion hyperfine qubits
title_fullStr High-fidelity quantum logic gates using trapped-ion hyperfine qubits
title_full_unstemmed High-fidelity quantum logic gates using trapped-ion hyperfine qubits
title_short High-fidelity quantum logic gates using trapped-ion hyperfine qubits
title_sort high fidelity quantum logic gates using trapped ion hyperfine qubits
work_keys_str_mv AT ballancec highfidelityquantumlogicgatesusingtrappedionhyperfinequbits
AT hartyt highfidelityquantumlogicgatesusingtrappedionhyperfinequbits
AT linken highfidelityquantumlogicgatesusingtrappedionhyperfinequbits
AT sepiolm highfidelityquantumlogicgatesusingtrappedionhyperfinequbits
AT lucasd highfidelityquantumlogicgatesusingtrappedionhyperfinequbits