The development of a 200 kV monochromated field emission electron source.

We report the development of a monochromator for an intermediate-voltage aberration-corrected electron microscope suitable for operation in both STEM and TEM imaging modes. The monochromator consists of two Wien filters with a variable energy selecting slit located between them and is located prior...

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Main Authors: Mukai, M, Kim, J, Omoto, K, Sawada, H, Kimura, A, Ikeda, A, Zhou, J, Kaneyama, T, Young, N, Warner, J, Nellist, P, Kirkland, A
Format: Journal article
Language:English
Published: Elsevier 2014
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author Mukai, M
Kim, J
Omoto, K
Sawada, H
Kimura, A
Ikeda, A
Zhou, J
Kaneyama, T
Young, N
Warner, J
Nellist, P
Kirkland, A
author_facet Mukai, M
Kim, J
Omoto, K
Sawada, H
Kimura, A
Ikeda, A
Zhou, J
Kaneyama, T
Young, N
Warner, J
Nellist, P
Kirkland, A
author_sort Mukai, M
collection OXFORD
description We report the development of a monochromator for an intermediate-voltage aberration-corrected electron microscope suitable for operation in both STEM and TEM imaging modes. The monochromator consists of two Wien filters with a variable energy selecting slit located between them and is located prior to the accelerator. The second filter cancels the energy dispersion produced by the first filter and after energy selection forms a round monochromated, achromatic probe at the specimen plane. The ultimate achievable energy resolution has been measured as 36 meV at 200 kV and 26 meV at 80 kV. High-resolution Annular Dark Field STEM images recorded using a monochromated probe resolve Si-Si spacings of 135.8 pm using energy spreads of 218 meV at 200 kV and 217 meV at 80 kV respectively. In TEM mode an improvement in non-linear spatial resolution to 64 pm due to the reduction in the effects of partial temporal coherence has been demonstrated using broad beam illumination with an energy spread of 134 meV at 200 kV.
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spelling oxford-uuid:369ed7ae-f236-423e-b8b9-e4999c564e7e2022-03-26T13:39:01ZThe development of a 200 kV monochromated field emission electron source.Journal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:369ed7ae-f236-423e-b8b9-e4999c564e7eEnglishSymplectic Elements at OxfordElsevier2014Mukai, MKim, JOmoto, KSawada, HKimura, AIkeda, AZhou, JKaneyama, TYoung, NWarner, JNellist, PKirkland, AWe report the development of a monochromator for an intermediate-voltage aberration-corrected electron microscope suitable for operation in both STEM and TEM imaging modes. The monochromator consists of two Wien filters with a variable energy selecting slit located between them and is located prior to the accelerator. The second filter cancels the energy dispersion produced by the first filter and after energy selection forms a round monochromated, achromatic probe at the specimen plane. The ultimate achievable energy resolution has been measured as 36 meV at 200 kV and 26 meV at 80 kV. High-resolution Annular Dark Field STEM images recorded using a monochromated probe resolve Si-Si spacings of 135.8 pm using energy spreads of 218 meV at 200 kV and 217 meV at 80 kV respectively. In TEM mode an improvement in non-linear spatial resolution to 64 pm due to the reduction in the effects of partial temporal coherence has been demonstrated using broad beam illumination with an energy spread of 134 meV at 200 kV.
spellingShingle Mukai, M
Kim, J
Omoto, K
Sawada, H
Kimura, A
Ikeda, A
Zhou, J
Kaneyama, T
Young, N
Warner, J
Nellist, P
Kirkland, A
The development of a 200 kV monochromated field emission electron source.
title The development of a 200 kV monochromated field emission electron source.
title_full The development of a 200 kV monochromated field emission electron source.
title_fullStr The development of a 200 kV monochromated field emission electron source.
title_full_unstemmed The development of a 200 kV monochromated field emission electron source.
title_short The development of a 200 kV monochromated field emission electron source.
title_sort development of a 200 kv monochromated field emission electron source
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