SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE

A position-sensitive detector has been combined with time-of-flight mass spectrometry in a short-flight-path atom probe to yield an instrument in which both the chemical identity and surface position are obtained for individual atoms removed by field evaporation from the surface of a field-ion speci...

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Autors principals:	Cerezo, A, Godfrey, T, Grovenor, C, Smith, G
Format:	Journal article
Idioma:	English
Publicat:	1989

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