IMPROVEMENTS IN THE TRANSMISSION OF VOLTAGE EVAPORATION PULSES IN THE ATOM-PROBE

IMPROVEMENTS IN THE TRANSMISSION OF VOLTAGE EVAPORATION PULSES IN THE ATOM-PROBE

A new arrangement for the transmission of voltage evaporation pulses in time-of-night atom probe instruments has been designed and implemented. A key feature in the design is the use of a flexible 50 Omega coaxial pulse line, continued within the vacuum system, to avoid reflections and losses in tra...

Bibliografski detalji
Glavni autori:	Sijbrandij, S, Cerezo, A, Smith, G
Format:	Conference item
Izdano:	1995

Slični predmeti

Improvements in the mass resolution of the three-dimensional atom probe
od: Sijbrandij, S, i dr.
Izdano: (1996)

IMPROVEMENTS IN 3-DIMENSIONAL ATOM-PROBE DESIGN
od: Cerezo, A, i dr.
Izdano: (1994)

THE EFFECT OF LASER-PULSE SHAPE ON MASS RESOLUTION IN THE PULSED-LASER ATOM PROBE
od: Cerezo, A, i dr.
Izdano: (1987)

Performance of an energy-compensated three-dimensional atom probe
od: Cerezo, A, i dr.
Izdano: (1998)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
od: Cerezo, A, i dr.
Izdano: (1985)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
od: Cerezo, A, i dr.
Izdano: (1986)

Applications of a high-resolution three dimensional atom probe
od: Smith, G, i dr.
Izdano: (1997)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
od: Grovenor, C, i dr.
Izdano: (1987)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
od: Smith, G, i dr.
Izdano: (1994)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
od: Cerezo, A, i dr.
Izdano: (1986)

Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe
od: Cerezo, A, i dr.
Izdano: (2006)

Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe
od: Cerezo, A, i dr.
Izdano: (2006)

Materials applications of an advanced 3-dimensional atom probe
od: Cerezo, A, i dr.
Izdano: (1996)

PULSED LASER ATOM PROBE CHARACTERIZATION OF SILICON-CARBIDE
od: Miller, M, i dr.
Izdano: (1989)

Aspects of the performance of a femtosecond laser-pulsed 3-dimensional atom probe.
od: Cerezo, A, i dr.
Izdano: (2007)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
od: Muller, M, i dr.
Izdano: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
od: Müller, M, i dr.
Izdano: (2010)

Field evaporation behavior during irradiation with picosecond laser pulses
od: Sha, G, i dr.
Izdano: (2008)

AN ATOM PROBE STUDY OF THE ANOMALOUS EVAPORATION OF ALLOYS CONTAINING SILICON
od: Miller, M, i dr.
Izdano: (1980)

Level set methods for modelling field evaporation in atom probe.
od: Haley, D, i dr.
Izdano: (2013)

Design of a scanning atom probe with improved mass resolution
od: Cerezo, A, i dr.
Izdano: (2000)

AN ATOM PROBE STUDY OF THE ANOMALOUS FIELD EVAPORATION OF ALLOYS CONTAINING SILICON
od: Miller, M, i dr.
Izdano: (1981)

Atomic scale characterization of buried In(x)Ga(1-x)As quantum dots using pulsed laser atom probe tomography
od: Mueller, M, i dr.
Izdano: (2008)

Influence of surface migration on the spatial resolution of pulsed laser atom probe tomography
od: Gault, B, i dr.
Izdano: (2010)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
od: Mackenzie, R, i dr.
Izdano: (1990)

THE POSITION-SENSITIVE ATOM PROBE - RECONSTRUCTION OF THE ATOMIC CHEMISTRY OF SOLIDS IN 3-DIMENSIONS (SUMMARY)
od: Cerezo, A, i dr.
Izdano: (1991)

Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
od: Cerezo, A, i dr.
Izdano: (2001)

Atom probe analysis of initial decomposition of Fe-N martensite
od: vanGenderen, M, i dr.
Izdano: (1997)

PULSED LASER ATOM PROBE ANALYSIS OF TERNARY AND QUATERNARY III-V EPITAXIAL LAYERS
od: Liddle, J, i dr.
Izdano: (1988)

Improvement of multilayer analyses with a three-dimensional atom probe
od: Vurpillot, F, i dr.
Izdano: (2004)

AN ELECTRONIC AND COMPUTER-SYSTEM FOR AN AUTOMATED ATOM PROBE
od: Cerezo, A, i dr.
Izdano: (1984)

Studies of boundaries and interfaces on the atomic scale by atom probe FIM
od: Smith, G, i dr.
Izdano: (1998)

Optimisation of a scanning atom probe with improved mass resolution using post deceleration.
od: Grennan-Heaven, N, i dr.
Izdano: (2007)

STATISTICAL-ANALYSIS OF ATOM PROBE DATA
od: Hetherington, M, i dr.
Izdano: (1986)

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
od: Grovenor, C, i dr.
Izdano: (1985)

STRUCTURAL-ANALYSIS WITH THE POSITION-SENSITIVE ATOM PROBE
od: Hetherington, M, i dr.
Izdano: (1992)

Atom probe analysis of the first stage of tempering of iron-carbon-nitrogen martensite
od: vanGenderen, M, i dr.
Izdano: (1997)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
od: Cerezo, A, i dr.
Izdano: (1988)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
od: Cerezo, A, i dr.
Izdano: (1988)

EINZEL LENSES IN ATOM PROBE DESIGNS
od: Cerezo, A, i dr.
Izdano: (1991)