RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

Pulsed Laser Atom Probe (PLAP) analysis has recently been applied to a range of semiconductor samples in Oxford. It has been shown for the first time that the stoichiometry of III-V semiconductors and of thin amorphous silicon layers, can be accurately analysed by the use of the PLAP. The compositio...

Bibliografski detalji
Glavni autori:	Grovenor, C, Cerezo, A, Smith, G
Format:	Journal article
Jezik:	English
Izdano:	1985

Slični predmeti

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
od: Grovenor, C, i dr.
Izdano: (1983)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
od: Grovenor, C, i dr.
Izdano: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
od: Grovenor, C, i dr.
Izdano: (1990)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
od: Smith, G, i dr.
Izdano: (1994)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
od: Cerezo, A, i dr.
Izdano: (1994)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
od: Cerezo, A, i dr.
Izdano: (1988)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
od: Cerezo, A, i dr.
Izdano: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
od: Grovenor, C, i dr.
Izdano: (1987)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
od: Cerezo, A, i dr.
Izdano: (1986)

APPLICATIONS OF ATOM-PROBE MICROANALYSIS IN MATERIALS SCIENCE
od: Miller, M, i dr.
Izdano: (1994)

QUANTITATIVE STUDY OF SOLID-STATE REACTIONS BY ATOM PROBE MICROANALYSIS
od: Smith, G
Izdano: (1987)

TRACE-ELEMENT DETECTION AT THE ATOMIC LEVEL BY ATOM PROBE MICROANALYSIS
od: Beaven, P, i dr.
Izdano: (1980)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
od: Godfrey, T, i dr.
Izdano: (1989)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
od: Mackenzie, R, i dr.
Izdano: (1990)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF NB3SN WIRES
od: Rose, J, i dr.
Izdano: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
od: Cerezo, A, i dr.
Izdano: (1985)

Microanalysis at the atomic level
od: Pennycook, S, i dr.
Izdano: (1995)

Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys.
od: Hudson, D, i dr.
Izdano: (2011)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
od: Cerezo, A, i dr.
Izdano: (1989)

Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis
od: Mueller, M, i dr.
Izdano: (2011)

Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors
od: Mueller, M, i dr.
Izdano: (2012)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
od: Cerezo, A, i dr.
Izdano: (1988)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
od: Müller, M, i dr.
Izdano: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
od: Muller, M, i dr.
Izdano: (2010)

ATOM PROBE STUDIES OF THE COMPOSITION OF LOW-TEMPERATURE OXIDES ON (100) SILICON AND GALLIUM-ARSENIDE SURFACES
od: Grovenor, C, i dr.
Izdano: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES
od: Liddle, J, i dr.
Izdano: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
od: Cerezo, A, i dr.
Izdano: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
od: Cerezo, A, i dr.
Izdano: (1989)

ULTRAHIGH RESOLUTION CHARACTERIZATION OF COMPOUND SEMICONDUCTORS USING PULSED LASER ATOM PROBE TECHNIQUES
od: Mackenzie, R, i dr.
Izdano: (1991)

ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
od: Cerezo, A, i dr.
Izdano: (1990)

CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING
od: Glaisher, R, i dr.
Izdano: (1993)

Quantitative Analysis of Be in Herderite by Electron Probe Microanalysis
od: Ze LIU, i dr.
Izdano: (2024-09-01)

APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
od: Liddle, J, i dr.
Izdano: (1989)

Overview: Recent progress in three-dimensional atom probe instruments and applications
od: Cerezo, A, i dr.
Izdano: (2007)

Overview: recent progress in three-dimensional atom probe instruments and applications.
od: Cerezo, A, i dr.
Izdano: (2007)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
od: Cerezo, A, i dr.
Izdano: (1989)

APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES
od: Cerezo, A, i dr.
Izdano: (1989)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
od: Cerezo, A, i dr.
Izdano: (1988)

Studies of boundaries and interfaces on the atomic scale by atom probe FIM
od: Smith, G, i dr.
Izdano: (1998)

THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS
od: Grovenor, C, i dr.
Izdano: (1982)