RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

Pulsed Laser Atom Probe (PLAP) analysis has recently been applied to a range of semiconductor samples in Oxford. It has been shown for the first time that the stoichiometry of III-V semiconductors and of thin amorphous silicon layers, can be accurately analysed by the use of the PLAP. The compositio...

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Bibliografiske detaljer
Main Authors:	Grovenor, C, Cerezo, A, Smith, G
Format:	Journal article
Sprog:	English
Udgivet:	1985

Lignende værker

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
af: Grovenor, C, et al.
Udgivet: (1983)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
af: Grovenor, C, et al.
Udgivet: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
af: Grovenor, C, et al.
Udgivet: (1990)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
af: Smith, G, et al.
Udgivet: (1994)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
af: Cerezo, A, et al.
Udgivet: (1994)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
af: Cerezo, A, et al.
Udgivet: (1988)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
af: Cerezo, A, et al.
Udgivet: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
af: Grovenor, C, et al.
Udgivet: (1987)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
af: Cerezo, A, et al.
Udgivet: (1986)

APPLICATIONS OF ATOM-PROBE MICROANALYSIS IN MATERIALS SCIENCE
af: Miller, M, et al.
Udgivet: (1994)

QUANTITATIVE STUDY OF SOLID-STATE REACTIONS BY ATOM PROBE MICROANALYSIS
af: Smith, G
Udgivet: (1987)

TRACE-ELEMENT DETECTION AT THE ATOMIC LEVEL BY ATOM PROBE MICROANALYSIS
af: Beaven, P, et al.
Udgivet: (1980)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
af: Godfrey, T, et al.
Udgivet: (1989)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
af: Mackenzie, R, et al.
Udgivet: (1990)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF NB3SN WIRES
af: Rose, J, et al.
Udgivet: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
af: Cerezo, A, et al.
Udgivet: (1985)

Microanalysis at the atomic level
af: Pennycook, S, et al.
Udgivet: (1995)

Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys.
af: Hudson, D, et al.
Udgivet: (2011)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
af: Cerezo, A, et al.
Udgivet: (1989)

Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis
af: Mueller, M, et al.
Udgivet: (2011)

Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors
af: Mueller, M, et al.
Udgivet: (2012)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
af: Cerezo, A, et al.
Udgivet: (1988)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
af: Müller, M, et al.
Udgivet: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
af: Muller, M, et al.
Udgivet: (2010)

ATOM PROBE STUDIES OF THE COMPOSITION OF LOW-TEMPERATURE OXIDES ON (100) SILICON AND GALLIUM-ARSENIDE SURFACES
af: Grovenor, C, et al.
Udgivet: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES
af: Liddle, J, et al.
Udgivet: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
af: Cerezo, A, et al.
Udgivet: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
af: Cerezo, A, et al.
Udgivet: (1989)

ULTRAHIGH RESOLUTION CHARACTERIZATION OF COMPOUND SEMICONDUCTORS USING PULSED LASER ATOM PROBE TECHNIQUES
af: Mackenzie, R, et al.
Udgivet: (1991)

ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
af: Cerezo, A, et al.
Udgivet: (1990)

CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING
af: Glaisher, R, et al.
Udgivet: (1993)

Quantitative Analysis of Be in Herderite by Electron Probe Microanalysis
af: Ze LIU, et al.
Udgivet: (2024-09-01)

APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
af: Liddle, J, et al.
Udgivet: (1989)

Overview: Recent progress in three-dimensional atom probe instruments and applications
af: Cerezo, A, et al.
Udgivet: (2007)

Overview: recent progress in three-dimensional atom probe instruments and applications.
af: Cerezo, A, et al.
Udgivet: (2007)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
af: Cerezo, A, et al.
Udgivet: (1989)

APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES
af: Cerezo, A, et al.
Udgivet: (1989)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
af: Cerezo, A, et al.
Udgivet: (1988)

Studies of boundaries and interfaces on the atomic scale by atom probe FIM
af: Smith, G, et al.
Udgivet: (1998)

THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS
af: Grovenor, C, et al.
Udgivet: (1982)