RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

Pulsed Laser Atom Probe (PLAP) analysis has recently been applied to a range of semiconductor samples in Oxford. It has been shown for the first time that the stoichiometry of III-V semiconductors and of thin amorphous silicon layers, can be accurately analysed by the use of the PLAP. The compositio...

Descrizione completa

Dettagli Bibliografici
Autori principali:	Grovenor, C, Cerezo, A, Smith, G
Natura:	Journal article
Lingua:	English
Pubblicazione:	1985

Documenti analoghi

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
di: Grovenor, C, et al.
Pubblicazione: (1983)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
di: Grovenor, C, et al.
Pubblicazione: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
di: Grovenor, C, et al.
Pubblicazione: (1990)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
di: Smith, G, et al.
Pubblicazione: (1994)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
di: Cerezo, A, et al.
Pubblicazione: (1994)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
di: Cerezo, A, et al.
Pubblicazione: (1988)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
di: Cerezo, A, et al.
Pubblicazione: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
di: Grovenor, C, et al.
Pubblicazione: (1987)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
di: Cerezo, A, et al.
Pubblicazione: (1986)

APPLICATIONS OF ATOM-PROBE MICROANALYSIS IN MATERIALS SCIENCE
di: Miller, M, et al.
Pubblicazione: (1994)

QUANTITATIVE STUDY OF SOLID-STATE REACTIONS BY ATOM PROBE MICROANALYSIS
di: Smith, G
Pubblicazione: (1987)

TRACE-ELEMENT DETECTION AT THE ATOMIC LEVEL BY ATOM PROBE MICROANALYSIS
di: Beaven, P, et al.
Pubblicazione: (1980)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
di: Godfrey, T, et al.
Pubblicazione: (1989)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
di: Mackenzie, R, et al.
Pubblicazione: (1990)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF NB3SN WIRES
di: Rose, J, et al.
Pubblicazione: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
di: Cerezo, A, et al.
Pubblicazione: (1985)

Microanalysis at the atomic level
di: Pennycook, S, et al.
Pubblicazione: (1995)

Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys.
di: Hudson, D, et al.
Pubblicazione: (2011)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
di: Cerezo, A, et al.
Pubblicazione: (1989)

Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis
di: Mueller, M, et al.
Pubblicazione: (2011)

Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors
di: Mueller, M, et al.
Pubblicazione: (2012)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
di: Cerezo, A, et al.
Pubblicazione: (1988)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
di: Müller, M, et al.
Pubblicazione: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
di: Muller, M, et al.
Pubblicazione: (2010)

ATOM PROBE STUDIES OF THE COMPOSITION OF LOW-TEMPERATURE OXIDES ON (100) SILICON AND GALLIUM-ARSENIDE SURFACES
di: Grovenor, C, et al.
Pubblicazione: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES
di: Liddle, J, et al.
Pubblicazione: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
di: Cerezo, A, et al.
Pubblicazione: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
di: Cerezo, A, et al.
Pubblicazione: (1989)

ULTRAHIGH RESOLUTION CHARACTERIZATION OF COMPOUND SEMICONDUCTORS USING PULSED LASER ATOM PROBE TECHNIQUES
di: Mackenzie, R, et al.
Pubblicazione: (1991)

ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
di: Cerezo, A, et al.
Pubblicazione: (1990)

CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING
di: Glaisher, R, et al.
Pubblicazione: (1993)

Quantitative Analysis of Be in Herderite by Electron Probe Microanalysis
di: Ze LIU, et al.
Pubblicazione: (2024-09-01)

APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
di: Liddle, J, et al.
Pubblicazione: (1989)

Overview: Recent progress in three-dimensional atom probe instruments and applications
di: Cerezo, A, et al.
Pubblicazione: (2007)

Overview: recent progress in three-dimensional atom probe instruments and applications.
di: Cerezo, A, et al.
Pubblicazione: (2007)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
di: Cerezo, A, et al.
Pubblicazione: (1989)

APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES
di: Cerezo, A, et al.
Pubblicazione: (1989)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
di: Cerezo, A, et al.
Pubblicazione: (1988)

Studies of boundaries and interfaces on the atomic scale by atom probe FIM
di: Smith, G, et al.
Pubblicazione: (1998)

THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS
di: Grovenor, C, et al.
Pubblicazione: (1982)