RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

Pulsed Laser Atom Probe (PLAP) analysis has recently been applied to a range of semiconductor samples in Oxford. It has been shown for the first time that the stoichiometry of III-V semiconductors and of thin amorphous silicon layers, can be accurately analysed by the use of the PLAP. The compositio...

書誌詳細
主要な著者:	Grovenor, C, Cerezo, A, Smith, G
フォーマット:	Journal article
言語:	English
出版事項:	1985

類似資料

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
著者:: Grovenor, C, 等
出版事項: (1983)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
著者:: Grovenor, C, 等
出版事項: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
著者:: Grovenor, C, 等
出版事項: (1990)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
著者:: Smith, G, 等
出版事項: (1994)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
著者:: Cerezo, A, 等
出版事項: (1994)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
著者:: Cerezo, A, 等
出版事項: (1988)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
著者:: Cerezo, A, 等
出版事項: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
著者:: Grovenor, C, 等
出版事項: (1987)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
著者:: Cerezo, A, 等
出版事項: (1986)

APPLICATIONS OF ATOM-PROBE MICROANALYSIS IN MATERIALS SCIENCE
著者:: Miller, M, 等
出版事項: (1994)

QUANTITATIVE STUDY OF SOLID-STATE REACTIONS BY ATOM PROBE MICROANALYSIS
著者:: Smith, G
出版事項: (1987)

TRACE-ELEMENT DETECTION AT THE ATOMIC LEVEL BY ATOM PROBE MICROANALYSIS
著者:: Beaven, P, 等
出版事項: (1980)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
著者:: Godfrey, T, 等
出版事項: (1989)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
著者:: Mackenzie, R, 等
出版事項: (1990)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF NB3SN WIRES
著者:: Rose, J, 等
出版事項: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
著者:: Cerezo, A, 等
出版事項: (1985)

Microanalysis at the atomic level
著者:: Pennycook, S, 等
出版事項: (1995)

Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys.
著者:: Hudson, D, 等
出版事項: (2011)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
著者:: Cerezo, A, 等
出版事項: (1989)

Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis
著者:: Mueller, M, 等
出版事項: (2011)

Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors
著者:: Mueller, M, 等
出版事項: (2012)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
著者:: Cerezo, A, 等
出版事項: (1988)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
著者:: Müller, M, 等
出版事項: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
著者:: Muller, M, 等
出版事項: (2010)

ATOM PROBE STUDIES OF THE COMPOSITION OF LOW-TEMPERATURE OXIDES ON (100) SILICON AND GALLIUM-ARSENIDE SURFACES
著者:: Grovenor, C, 等
出版事項: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES
著者:: Liddle, J, 等
出版事項: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
著者:: Cerezo, A, 等
出版事項: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
著者:: Cerezo, A, 等
出版事項: (1989)

ULTRAHIGH RESOLUTION CHARACTERIZATION OF COMPOUND SEMICONDUCTORS USING PULSED LASER ATOM PROBE TECHNIQUES
著者:: Mackenzie, R, 等
出版事項: (1991)

ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
著者:: Cerezo, A, 等
出版事項: (1990)

CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING
著者:: Glaisher, R, 等
出版事項: (1993)

Quantitative Analysis of Be in Herderite by Electron Probe Microanalysis
著者:: Ze LIU, 等
出版事項: (2024-09-01)

APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
著者:: Liddle, J, 等
出版事項: (1989)

Overview: Recent progress in three-dimensional atom probe instruments and applications
著者:: Cerezo, A, 等
出版事項: (2007)

Overview: recent progress in three-dimensional atom probe instruments and applications.
著者:: Cerezo, A, 等
出版事項: (2007)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
著者:: Cerezo, A, 等
出版事項: (1989)

APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES
著者:: Cerezo, A, 等
出版事項: (1989)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
著者:: Cerezo, A, 等
出版事項: (1988)

Studies of boundaries and interfaces on the atomic scale by atom probe FIM
著者:: Smith, G, 等
出版事項: (1998)

THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS
著者:: Grovenor, C, 等
出版事項: (1982)