RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.

Pulsed Laser Atom Probe (PLAP) analysis has recently been applied to a range of semiconductor samples in Oxford. It has been shown for the first time that the stoichiometry of III-V semiconductors and of thin amorphous silicon layers, can be accurately analysed by the use of the PLAP. The compositio...

Bibliográfalaš dieđut
Váldodahkkit:	Grovenor, C, Cerezo, A, Smith, G
Materiálatiipa:	Journal article
Giella:	English
Almmustuhtton:	1985

Geahča maid

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF SEMICONDUCTOR-MATERIALS
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1983)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1990)

RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1990)

RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
Dahkki: Smith, G, et al.
Almmustuhtton: (1994)

Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1994)

APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1988)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1987)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1986)

APPLICATIONS OF ATOM-PROBE MICROANALYSIS IN MATERIALS SCIENCE
Dahkki: Miller, M, et al.
Almmustuhtton: (1994)

QUANTITATIVE STUDY OF SOLID-STATE REACTIONS BY ATOM PROBE MICROANALYSIS
Dahkki: Smith, G
Almmustuhtton: (1987)

TRACE-ELEMENT DETECTION AT THE ATOMIC LEVEL BY ATOM PROBE MICROANALYSIS
Dahkki: Beaven, P, et al.
Almmustuhtton: (1980)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF VANADIUM
Dahkki: Godfrey, T, et al.
Almmustuhtton: (1989)

PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTOR EPILAYERS
Dahkki: Mackenzie, R, et al.
Almmustuhtton: (1990)

FIELD-ION MICROSCOPY AND ATOM PROBE MICROANALYSIS OF NB3SN WIRES
Dahkki: Rose, J, et al.
Almmustuhtton: (1986)

PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1985)

Microanalysis at the atomic level
Dahkki: Pennycook, S, et al.
Almmustuhtton: (1995)

Optimisation of mass ranging for atom probe microanalysis and application to the corrosion processes in Zr alloys.
Dahkki: Hudson, D, et al.
Almmustuhtton: (2011)

SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1989)

Accuracy of pulsed laser atom probe tomography for compound semiconductor analysis
Dahkki: Mueller, M, et al.
Almmustuhtton: (2011)

Compositional nonuniformities in pulsed laser atom probe tomography analysis of compound semiconductors
Dahkki: Mueller, M, et al.
Almmustuhtton: (2012)

ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1988)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
Dahkki: Müller, M, et al.
Almmustuhtton: (2010)

Nanoscale characterization of compound semiconductors using laser-pulsed atom probe tomography
Dahkki: Muller, M, et al.
Almmustuhtton: (2010)

ATOM PROBE STUDIES OF THE COMPOSITION OF LOW-TEMPERATURE OXIDES ON (100) SILICON AND GALLIUM-ARSENIDE SURFACES
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTI-QUANTUM-WELL STRUCTURES
Dahkki: Liddle, J, et al.
Almmustuhtton: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1989)

POSITION-SENSITIVE ATOM PROBE ANALYSIS OF MULTIPLE QUANTUM-WELL STRUCTURES
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1989)

ULTRAHIGH RESOLUTION CHARACTERIZATION OF COMPOUND SEMICONDUCTORS USING PULSED LASER ATOM PROBE TECHNIQUES
Dahkki: Mackenzie, R, et al.
Almmustuhtton: (1991)

ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1990)

CHEMICAL MICROANALYSIS OF SEMICONDUCTOR HETEROSTRUCTURES BY THICKNESS FRINGE IMAGING
Dahkki: Glaisher, R, et al.
Almmustuhtton: (1993)

Quantitative Analysis of Be in Herderite by Electron Probe Microanalysis
Dahkki: Ze LIU, et al.
Almmustuhtton: (2024-09-01)

APPLICATION OF POSITION-SENSITIVE ATOM PROBE TO THE STUDY OF THE MICROCHEMISTRY AND MORPHOLOGY OF QUANTUM WELL INTERFACES
Dahkki: Liddle, J, et al.
Almmustuhtton: (1989)

Overview: Recent progress in three-dimensional atom probe instruments and applications
Dahkki: Cerezo, A, et al.
Almmustuhtton: (2007)

Overview: recent progress in three-dimensional atom probe instruments and applications.
Dahkki: Cerezo, A, et al.
Almmustuhtton: (2007)

MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1989)

APPLICATION OF A POSITION-SENSITIVE ATOM PROBE TO THE ANALYSIS OF THE CHEMISTRY AND MORPHOLOGY OF MULTI-QUANTUM-WELL INTERFACES
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1989)

DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
Dahkki: Cerezo, A, et al.
Almmustuhtton: (1988)

Studies of boundaries and interfaces on the atomic scale by atom probe FIM
Dahkki: Smith, G, et al.
Almmustuhtton: (1998)

THE CHARACTERIZATION OF SILICON SURFACES BY TIME-OF-FLIGHT ATOM PROBE ANALYSIS
Dahkki: Grovenor, C, et al.
Almmustuhtton: (1982)