Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy

Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy

We observed Pt nanoparticles on carbon nanohorn aggregates by annular dark-field scanning confocal electron microscopy (ADF-SCEM) with an aberration-corrected microscope for three-dimensional (3D) imaging. The object elongation length along an optical axis that corresponds to the depth resolution wa...

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Bibliographic Details
Main Authors: Hashimoto, A, Wang, P, Shimojo, M, Mitsuishi, K, Nellist, P, Kirkland, A, Takeguchi, M
Format: Journal article
Language:English
Published: 2012

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