Measuring errors in single-qubit rotations by pulsed electron paramagnetic resonance
The ability to measure and reduce systematic errors in single-qubit logic gates is crucial when evaluating quantum computing implementations. We describe pulsed electron paramagnetic resonance (EPR) sequences that can be used to measure precisely even small systematic errors in rotations of electron...
Main Authors: | Morton, J, Tyryshkin, A, Ardavan, A, Porfyrakis, K, Lyon, SA, Briggs, G |
---|---|
פורמט: | Journal article |
שפה: | English |
יצא לאור: |
2005
|
פריטים דומים
-
Measuring errors in single-qubit rotations by pulsed electron paramagnetic resonance
מאת: Morton, J, et al.
יצא לאור: (2005) -
High fidelity single qubit operations using pulsed electron paramagnetic resonance.
מאת: Morton, J, et al.
יצא לאור: (2005) -
High fidelity single qubit operations using pulsed electron paramagnetic resonance
מאת: Morton, J, et al.
יצא לאור: (2005) -
Bang-bang control of fullerene qubits using ultrafast phase gates
מאת: Morton, J, et al.
יצא לאור: (2006) -
Bang–bang control of fullerene qubits using ultrafast phase gates
מאת: Morton, J, et al.
יצא לאור: (2006)