APA-ийн эшлэл(7 дахь хэвлэлт)

Zheng, R., Moody, M., Gault, B., Liu, Z., Liu, H., & Ringer, S. (2009). On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography.

Чикаго-гийн эшлэл (17 дахь хэвлэлт)

Zheng, R., M. Moody, B. Gault, Z. Liu, H. Liu, ба S. Ringer. On the Understanding of the Microscopic Origin of the Properties of Diluted Magnetic Semiconductors by Atom Probe Tomography. 2009.

MLA -ийн эшлэл (9 дэх хэвлэлт)

Zheng, R., et al. On the Understanding of the Microscopic Origin of the Properties of Diluted Magnetic Semiconductors by Atom Probe Tomography. 2009.