APA (7th ed.) Citation

Zheng, R., Moody, M., Gault, B., Liu, Z., Liu, H., & Ringer, S. (2009). On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography.

Chicago Style (17th ed.) Citation

Zheng, R., M. Moody, B. Gault, Z. Liu, H. Liu, and S. Ringer. On the Understanding of the Microscopic Origin of the Properties of Diluted Magnetic Semiconductors by Atom Probe Tomography. 2009.

MLA (9th ed.) Citation

Zheng, R., et al. On the Understanding of the Microscopic Origin of the Properties of Diluted Magnetic Semiconductors by Atom Probe Tomography. 2009.