Zheng, R., Moody, M., Gault, B., Liu, Z., Liu, H., & Ringer, S. (2009). On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography.
Chicago-Zitierstil (17. Ausg.)Zheng, R., M. Moody, B. Gault, Z. Liu, H. Liu, und S. Ringer. On the Understanding of the Microscopic Origin of the Properties of Diluted Magnetic Semiconductors by Atom Probe Tomography. 2009.
MLA-Zitierstil (9. Ausg.)Zheng, R., et al. On the Understanding of the Microscopic Origin of the Properties of Diluted Magnetic Semiconductors by Atom Probe Tomography. 2009.
Achtung: Diese Zitate sind unter Umständen nicht zu 100% korrekt.