APA način citiranja (7. izdanje)

Zheng, R., Moody, M., Gault, B., Liu, Z., Liu, H., & Ringer, S. (2009). On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography.

Čikaški stil citiranja (17. izdanje)

Zheng, R., M. Moody, B. Gault, Z. Liu, H. Liu, i S. Ringer. On the Understanding of the Microscopic Origin of the Properties of Diluted Magnetic Semiconductors by Atom Probe Tomography. 2009.

MLA način citiranja (9. izdanje)

Zheng, R., et al. On the Understanding of the Microscopic Origin of the Properties of Diluted Magnetic Semiconductors by Atom Probe Tomography. 2009.