Zheng, R., Moody, M., Gault, B., Liu, Z., Liu, H., & Ringer, S. (2009). On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography.
芝加哥风格引文Zheng, R., M. Moody, B. Gault, Z. Liu, H. Liu, 与 S. Ringer. On the Understanding of the Microscopic Origin of the Properties of Diluted Magnetic Semiconductors by Atom Probe Tomography. 2009.
MLA引文Zheng, R., et al. On the Understanding of the Microscopic Origin of the Properties of Diluted Magnetic Semiconductors by Atom Probe Tomography. 2009.
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