On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography

On the understanding of the microscopic origin of the properties of diluted magnetic semiconductors by atom probe tomography

Spintronics, in which both the spin and charge of electrons are used for logic and memory operations, promises to revolutionize the current information technology. Just as silicon supports microelectronics, diluted magnetic semiconductors (DMSs) will be the platform of spintronics. Ideal DMSs should...

Bibliográfalaš dieđut
Váldodahkkit:	Zheng, R, Moody, M, Gault, B, Liu, Z, Liu, H, Ringer, S
Materiálatiipa:	Journal article
Giella:	English
Almmustuhtton:	2009

Geahča maid

Atom Probe Tomography at The University of Sydney
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New techniques for the analysis of fine-scaled clustering phenomena within atom probe tomography (APT) data.
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Statistical tools for the local electrode atom probe
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Spatial decomposition of molecular ions within 3D atom probe reconstructions.
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Bringing atom probe tomography to transmission electron microscopes
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Overcoming challenges in the study of nitrided microalloyed steels using atom probe.
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diluted magnetic semiconductors /
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Advances in the calibration of atom probe tomographic reconstruction
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Restoring the lattice of Si-based atom probe reconstructions for enhanced information on dopant positioning.
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Modeling and simulation in atom probe tomography
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Mining information from atom probe data
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Effect of Sn Addition in Preprecipitation Stage in Al-Cu Alloys: A Correlative Transmission Electron Microscopy and Atom Probe Tomography Study
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Origins of the hydrogen signal in atom probe tomography: case studies of alkali and noble metals
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