Fault-tolerant protection of near-term trapped-ion topological qubits under realistic noise sources

Fault-tolerant protection of near-term trapped-ion topological qubits under realistic noise sources

Detalles Bibliográficos
Main Authors: Bermudez, A, Xu, X, Gutierrez, M, Benjamin, S, Müller, M
Formato: Journal article
Publicado: American Physical Society 2019

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