Exchange bias interactions in polycrystalline/amorphous bilayers
Main Authors: | Dean, J, Kovacs, A, Kohn, A, Goncharov, A, Bashir, M, Hrkac, G, Allwood, D, Schrefl, T |
---|---|
Format: | Journal article |
Published: |
2010
|
Similar Items
-
Reversal Mechanism of Exchange-Biased CoFeB/IrMn Bilayers Observed by Lorentz Electron Microscopy
by: Kovacs, A, et al.
Published: (2009) -
Polycrystalline and amorphous thin films and devices /
by: Kazmerski, Lawrence L.
Published: (1980) -
The structural characterisation of molecular beam epitaxy-grown exchange-biased bilayers
by: Choi, Y, et al.
Published: (2002) -
ELECTRON-DIFFRACTION ANALYSIS OF POLYCRYSTALLINE AND AMORPHOUS THIN-FILMS
by: Cockayne, D, et al.
Published: (1988) -
ELECTRON-DIFFRACTION ANALYSIS OF POLYCRYSTALLINE AND AMORPHOUS THIN-FILMS
by: Cockayne, D, et al.
Published: (1988)