Investigation of threading dislocation blocking in strained-layer InGaAs/GaAs heterostructures using scanning cathodoluminescence microscopy
المؤلفون الرئيسيون: | Russell, J, Zou, J, Moon, A, Cockayne, D |
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التنسيق: | Journal article |
منشور في: |
2000
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مواد مشابهة
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Cathodoluminescence study of oval defects in MBE grown InGaAs/GaAs
حسب: RussellHarriott, J, وآخرون
منشور في: (1996) -
Investigation of oval defects in InGaAs/GaAs strained-layer heterostructures using cathodoluminescence and wavelength dispersive spectroscopy
حسب: Russell-Harriott, J, وآخرون
منشور في: (1998) -
Oval defects in InGaAs/GaAs heterostructures
حسب: Russell-Harriott, J, وآخرون
منشور في: (1998) -
Estimation of the MQW InGaAs/GaAs heterostructures stability to the formation of misfit dislocations
حسب: A. A. Maldzhy, وآخرون
منشور في: (2006-12-01) -
Misfit dislocations generated from inhomogeneous sources and their critical thicknesses in a InGaAs/GaAs heterostructure grown by molecular beam epitaxy
حسب: Zou, J, وآخرون
منشور في: (1997)