Investigation of threading dislocation blocking in strained-layer InGaAs/GaAs heterostructures using scanning cathodoluminescence microscopy

Antzeko izenburuak

• Cathodoluminescence study of oval defects in MBE grown InGaAs/GaAs
  nork: RussellHarriott, J, et al.
  Argitaratua: (1996)
• Investigation of oval defects in InGaAs/GaAs strained-layer heterostructures using cathodoluminescence and wavelength dispersive spectroscopy
  nork: Russell-Harriott, J, et al.
  Argitaratua: (1998)
• Oval defects in InGaAs/GaAs heterostructures
  nork: Russell-Harriott, J, et al.
  Argitaratua: (1998)
• Estimation of the MQW InGaAs/GaAs heterostructures stability to the formation of misfit dislocations
  nork: A. A. Maldzhy, et al.
  Argitaratua: (2006-12-01)
• Misfit dislocations generated from inhomogeneous sources and their critical thicknesses in a InGaAs/GaAs heterostructure grown by molecular beam epitaxy
  nork: Zou, J, et al.
  Argitaratua: (1997)