SURFACE SEGREGATION OF SB IN DOPED TIO2 RUTILE

SURFACE SEGREGATION OF SB IN DOPED TIO2 RUTILE

The surface concentration of Sb in doped TiO2 rutile ceramics (Ti1 - 5 4xSbxO2 0 < x < 0.1), has been measured by means of angle-resolved core level X-ray photoelectron spectroscopy (AR-XPS). Depth profiles have been obtained by alternating Ar+-ion bombardment with core level measureme...

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Bibliographic Details
Main Authors:	Gulino, A, Condorelli, G, Fragala, I, Egdell, R
Format:	Journal article
Published:	1995

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