SURFACE SEGREGATION OF SB IN DOPED TIO2 RUTILE
The surface concentration of Sb in doped TiO2 rutile ceramics (Ti1 - 5 4xSbxO2 0 < x < 0.1), has been measured by means of angle-resolved core level X-ray photoelectron spectroscopy (AR-XPS). Depth profiles have been obtained by alternating Ar+-ion bombardment with core level measureme...
| मुख्य लेखकों: | , , , |
|---|---|
| स्वरूप: | Journal article |
| प्रकाशित: |
1995
|