Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging

相似書籍

• Residual stress measurement in thin films at sub-micron scale using Focused Ion Beam milling and imaging
  由: Song, X, et al.
  出版: (2012)
• Residual stress measurement in thin films using the semi-destructive ring-core drilling method using Focused Ion Beam
  由: Song, X, et al.
  出版: (2011)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  由: Sebastiani, M, et al.
  出版: (2014)
• Focused ion beam four-slot milling for Poisson's ratio and residual stress evaluation at the micron scale
  由: Sebastiani, M, et al.
  出版: (2014)
• Focused ion beam ring drilling for residual stress evaluation
  由: Korsunsky, A, et al.
  出版: (2009)