Low-dose aberration corrected cryo-electron microscopy of organic specimens.
Spherical aberration (C(s)) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose...
| Principais autores: | , , , , , |
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| Formato: | Journal article |
| Idioma: | English |
| Publicado em: |
2008
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