Atom probe tomography today
This review aims to describe and illustrate the advances in the application of atom probe tomography that have been made possible by recent developments, particularly in specimen preparation techniques (using dual-beam focused-ion beam instruments) but also of the more routine use of laser pulsing....
| 主要な著者: | , , , , , , , , , , , , |
|---|---|
| フォーマット: | Journal article |
| 出版事項: |
2007
|
Search Result 1
