Diffraction effects and inelastic electron transport in angle-resolved microscopic imaging applications
We analyse the signal formation process for scanning electronmicroscopic imaging applications on crystalline specimens. Inaccordance with previous investigations, we find nontrivialeffects of incident beam diffraction on the backscattered elec-tron distribution in energy and momentum. Specifically,...
| Hoofdauteurs: | , , , , , , , |
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| Formaat: | Journal article |
| Gepubliceerd in: |
Wiley
2017
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