The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy

Images and spectra obtained from aberration corrected scanning transmission electron microscopes (STEM) are now used routinely to quantify the morphology, structure, composition, chemistry, bonding, and optical/electronic properties of nanostructures, interfaces, and defects in many materials/biolog...

Mô tả đầy đủ

Chi tiết về thư mục
Những tác giả chính: Browning, ND, Castagna, J, Kirkland, AI, Moshtaghpour, A, Nicholls, D, Robinson, AW, Wells, J, Zheng, Y
Định dạng: Journal article
Ngôn ngữ:English
Được phát hành: AIP Publishing 2023