Indirect Super Resolved Microscopy in the TEM.
Main Author: | Kirkland, A |
---|---|
Format: | Journal article |
Published: |
日本電子顕微鏡学会
1999
|
Similar Items
-
Indirect super resolved microscopy in the TEM
by: Kirkland, A, et al.
Published: (1999) -
Super-Resolved Traction Force Microscopy (STFM).
by: Colin-York, H, et al.
Published: (2016) -
Super-resolved traction force microscopy (STFM)
by: Colin-York, H, et al.
Published: (2016) -
High-resolution TEM and the application of direct and indirect aberration correction.
by: Hetherington, C, et al.
Published: (2008) -
Focus image scanning microscopy for sharp and gentle super-resolved microscopy
by: Giorgio Tortarolo, et al.
Published: (2022-12-01)