Magnetic ordering in Cr-doped Bi₂Se₃ thin films

Magnetic ordering in Cr-doped Bi₂Se₃ thin films

We report the structural and magnetic study of Cr-doped Bi2Se3 thin films using x-ray diffraction (XRD), magnetometry and polarized neutron reflectometry (PNR). Epitaxial layers were grown on c-plane sapphire by molecular beam epitaxy in a two-step process. Highresolution XRD shows the exceptionally...

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Номзүйн дэлгэрэнгүй
Үндсэн зохиолчид:	Collins-Mcintyre, LJ, Harrison, SE, Schoenherr, P, Steinke, N-J, Kinane, CJ, Charlton, TR, Alba-Veneroa, D, Phusp, A, Kellock, AJ, Parkin, SSP, Harris, JS, Langridge, S, van der Laan, G, Hesjedal, T
Формат:	Journal article
Хэл сонгох:	English
Хэвлэсэн:	European Physical Society 2014

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