Dielectric and infrared properties of ultrathin SiO2 layers on Si(100)
Autors principals: | Giustino, F, Pasquarello, A |
---|---|
Format: | Conference item |
Publicat: |
2006
|
Ítems similars
-
Infrared properties of ultrathin oxides on Si(100)
per: Giustino, F, et al.
Publicat: (2005) -
Atomistic models of the Si(100)-SiO(2) interface: structural, electronic and dielectric properties
per: Giustino, F, et al.
Publicat: (2005) -
Infrared spectra at surfaces and interfaces from first principles: evolution of the spectra across the Si(100)-SiO2 interface.
per: Giustino, F, et al.
Publicat: (2005) -
Atomic-scale modelling of the Si(100)-SiO(2) interface
per: Giustino, F, et al.
Publicat: (2005) -
Electronic structure at realistic Si(100)-SiO2 interfaces
per: Giustino, F, et al.
Publicat: (2004)