Dielectric and infrared properties of ultrathin SiO2 layers on Si(100)
Prif Awduron: | Giustino, F, Pasquarello, A |
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Fformat: | Conference item |
Cyhoeddwyd: |
2006
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Eitemau Tebyg
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Infrared properties of ultrathin oxides on Si(100)
gan: Giustino, F, et al.
Cyhoeddwyd: (2005) -
Atomistic models of the Si(100)-SiO(2) interface: structural, electronic and dielectric properties
gan: Giustino, F, et al.
Cyhoeddwyd: (2005) -
Infrared spectra at surfaces and interfaces from first principles: evolution of the spectra across the Si(100)-SiO2 interface.
gan: Giustino, F, et al.
Cyhoeddwyd: (2005) -
Atomic-scale modelling of the Si(100)-SiO(2) interface
gan: Giustino, F, et al.
Cyhoeddwyd: (2005) -
Electronic structure at realistic Si(100)-SiO2 interfaces
gan: Giustino, F, et al.
Cyhoeddwyd: (2004)