Dielectric and infrared properties of ultrathin SiO2 layers on Si(100)
Κύριοι συγγραφείς: | Giustino, F, Pasquarello, A |
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Μορφή: | Conference item |
Έκδοση: |
2006
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Παρόμοια τεκμήρια
Παρόμοια τεκμήρια
-
Infrared properties of ultrathin oxides on Si(100)
ανά: Giustino, F, κ.ά.
Έκδοση: (2005) -
Atomistic models of the Si(100)-SiO(2) interface: structural, electronic and dielectric properties
ανά: Giustino, F, κ.ά.
Έκδοση: (2005) -
Infrared spectra at surfaces and interfaces from first principles: evolution of the spectra across the Si(100)-SiO2 interface.
ανά: Giustino, F, κ.ά.
Έκδοση: (2005) -
Atomic-scale modelling of the Si(100)-SiO(2) interface
ανά: Giustino, F, κ.ά.
Έκδοση: (2005) -
Electronic structure at realistic Si(100)-SiO2 interfaces
ανά: Giustino, F, κ.ά.
Έκδοση: (2004)