Dielectric and infrared properties of ultrathin SiO2 layers on Si(100)

Dielectric and infrared properties of ultrathin SiO2 layers on Si(100)

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	Giustino, F, Pasquarello, A
Formáid:	Conference item
Foilsithe / Cruthaithe:	2006

Míreanna comhchosúla

Infrared properties of ultrathin oxides on Si(100)
de réir: Giustino, F, et al.
Foilsithe / Cruthaithe: (2005)

Atomistic models of the Si(100)-SiO(2) interface: structural, electronic and dielectric properties
de réir: Giustino, F, et al.
Foilsithe / Cruthaithe: (2005)

Infrared spectra at surfaces and interfaces from first principles: evolution of the spectra across the Si(100)-SiO2 interface.
de réir: Giustino, F, et al.
Foilsithe / Cruthaithe: (2005)

Atomic-scale modelling of the Si(100)-SiO(2) interface
de réir: Giustino, F, et al.
Foilsithe / Cruthaithe: (2005)

Electronic structure at realistic Si(100)-SiO2 interfaces
de réir: Giustino, F, et al.
Foilsithe / Cruthaithe: (2004)

Proton-induced fixed positive charge at the Si(100)-SiO2 interface.
de réir: Godet, J, et al.
Foilsithe / Cruthaithe: (2007)

Atomistic model of the 4H(0001)SiC-SiO2 interface: structural and electronic properties
de réir: Devynck, F, et al.
Foilsithe / Cruthaithe: (2007)

Atomistic model of the 4H(0001)SiC-SiO2 interface: Structural and electronic properties
de réir: Devynck, F, et al.
Foilsithe / Cruthaithe: (2007)

Dielectric effect of a thin SiO2 interlayer at the interface between silicon and high-k oxides
de réir: Giustino, F, et al.
Foilsithe / Cruthaithe: (2004)

Modeling of Si 2p core-level shifts at Si-(ZrO(2))(x)(SiO(2))(1-x) interfaces
de réir: Giustino, F, et al.
Foilsithe / Cruthaithe: (2002)

Abrupt model interface for the 4H(1000)SiC-SiO2 interface
de réir: Devynck, F, et al.
Foilsithe / Cruthaithe: (2005)

First-principles theory of infrared absorption spectra at surfaces and interfaces: Application to the Si(100): H(2)O surface
de réir: Giustino, F, et al.
Foilsithe / Cruthaithe: (2008)

Band offsets at the Si/SiO2 interface from many-body perturbation theory
de réir: Shaltaf, R, et al.
Foilsithe / Cruthaithe: (2008)

Band offsets at the Si/SiO2 interface from many-body perturbation theory.
de réir: Shaltaf, R, et al.
Foilsithe / Cruthaithe: (2008)

Acoustic spectroscopy and electrical characterization of SiO2/Si structures with ultrathin SiO2 layers formed by nitric acid oxidation
de réir: Bury Peter, et al.
Foilsithe / Cruthaithe: (2009-06-01)

Structural and electronic properties of an abrupt 4H-SiC(0001)/SiO2 interface model: Classical molecular dynamics simulations and density functional calculations
de réir: Devynck, F, et al.
Foilsithe / Cruthaithe: (2007)

Influence of SiO2 layer on the dielectric function of gold nanoparticles on Si substrate
de réir: Chen, T. P., et al.
Foilsithe / Cruthaithe: (2014)

Metastable ultrathin crystal in thermally grown SiO2 film on Si substrate
de réir: Koji Kimoto, et al.
Foilsithe / Cruthaithe: (2012-12-01)

Dielectric discontinuity at interfaces in the atomic-scale limit: permittivity of ultrathin oxide films on silicon.
de réir: Giustino, F, et al.
Foilsithe / Cruthaithe: (2003)

Vertically grown ultrathin Bi2SiO5 as high-κ single-crystalline gate dielectric
de réir: Jiabiao Chen, et al.
Foilsithe / Cruthaithe: (2023-07-01)

BAND ALIGNMENT OF ULTRATHIN GIZO/SiO2/Si HETEROSTRUCTURE DETERMINED BY ELECTRON SPECTROSCOPY
de réir: Hee Jae Kang2, et al.
Foilsithe / Cruthaithe: (2011-11-01)

Dielectric functions of densely stacked Si nanocrystal layer embedded in SiO2 thin films
de réir: Ding, Liang, et al.
Foilsithe / Cruthaithe: (2010)

On the Properties of the Si-SiO2 Transition Layer in Multilayer Silicon Structures
de réir: Shakhrukh Kh. Daliev, et al.
Foilsithe / Cruthaithe: (2023-12-01)

Efficient Silicon Light-Emitting-Diodes with a p-Si/Ultrathin SiO2/n-Si Structure
de réir: Shucheng Chu, et al.
Foilsithe / Cruthaithe: (2011-01-01)

Comparative Study of SiO2, Al2O3, and BeO Ultrathin Interfacial Barrier Layers in Si Metal-Oxide-Semiconductor Devices
de réir: J. H. Yum, et al.
Foilsithe / Cruthaithe: (2012-01-01)

Improved Efficiency of Flexible Organic Light-Emitting Diodes by Insertion of Ultrathin SiO2 Buffer Layers
de réir: Chien-Jung Huang, et al.
Foilsithe / Cruthaithe: (2013-01-01)

Total Ionizing Dose Effects of Si Vertical Diffused MOSFET with SiO2 and Si3N4/SiO2 Gate Dielectrics
de réir: Jiongjiong Mo, et al.
Foilsithe / Cruthaithe: (2017-01-01)

On the location and stability of charge in SiO2/SiNx dielectric double layers used for silicon surface passivation
de réir: Bonilla, R, et al.
Foilsithe / Cruthaithe: (2014)

The formation and evolution of SiO/SiO2 nanostructures /
de réir: 437818 Nurul Huda Abu Bakar, et al.
Foilsithe / Cruthaithe: (2009)

Growth of metastable 2H-CaSi2 films on Si(111) substrates with ultrathin SiO2 films by solid phase epitaxy
de réir: Keiichiro Oh-ishi, et al.
Foilsithe / Cruthaithe: (2023-01-01)

Enhanced Mechanical and Dielectric Properties of Polyurethane Elastomers Containing Modified SiO2
de réir: Miaomiao Qian, et al.
Foilsithe / Cruthaithe: (2024-11-01)

Fabrication of ZnO/SiO2 and SiO2/α-Zn2SiO4 composites with dye adsorption and antimicrobial properties
de réir: Kurniawan Hendris Hendarsyah, et al.
Foilsithe / Cruthaithe: (2024-09-01)

A comparative study on the dielectric functions of isolated Si nanocrystals and densely-stacked Si nanocrystal layer embedded in SiO2 synthesized with Si ion implantation
de réir: Ding, Liang, et al.
Foilsithe / Cruthaithe: (2011)

Influence of Annealing on the Dielectric Properties of Zn-SiO<sub>2</sub>/Si Nanocomposites Obtained in “Hot” Implantation Conditions
de réir: Tomasz N. Kołtunowicz, et al.
Foilsithe / Cruthaithe: (2022-10-01)

TRANSPARENT SUPERHYDROPHILIC SiO2/TiO2/SiO2 TRI-LAYER NANOSTRUCTURED ANTIFOGGING THIN FILM
de réir: Eshaghi A., et al.
Foilsithe / Cruthaithe: (2013-09-01)

Kajian kadar kepudaran luminesens terma serabut optik SiO2(AI), SiO2 (Ge) dan TLD-100 /
de réir: 436047 Noor Hayati Anuar, et al.
Foilsithe / Cruthaithe: (2009)

Structural and electronic properties of the transition layer at the SiO2/4H-SiC interface
de réir: Wenbo Li, et al.
Foilsithe / Cruthaithe: (2015-01-01)

Synthesis and Luminescence Properties of Core-Shell-Shell Composites: SiO<sub>2</sub>@PMDA-Si-Tb@SiO<sub>2</sub> and SiO<sub>2</sub>@PMDA-Si-Tb-phen@SiO<sub>2</sub>
de réir: Lina Feng, et al.
Foilsithe / Cruthaithe: (2019-02-01)

Nano Organic Transistor with SiO2 / Poly VinylPyrrolidone Dielectric
de réir: S. A. Hashemizadeh
Foilsithe / Cruthaithe: (2016-01-01)

Al@SiO2 Core–Shell Fillers Enhance Dielectric Properties of Silicone Composites
de réir: Bin Huang, et al.
Foilsithe / Cruthaithe: (2023-09-01)