Dielectric and infrared properties of ultrathin SiO2 layers on Si(100)

Ítems similars

• Infrared properties of ultrathin oxides on Si(100)
  per: Giustino, F, et al.
  Publicat: (2005)
• Atomistic models of the Si(100)-SiO(2) interface: structural, electronic and dielectric properties
  per: Giustino, F, et al.
  Publicat: (2005)
• Infrared spectra at surfaces and interfaces from first principles: evolution of the spectra across the Si(100)-SiO2 interface.
  per: Giustino, F, et al.
  Publicat: (2005)
• Atomic-scale modelling of the Si(100)-SiO(2) interface
  per: Giustino, F, et al.
  Publicat: (2005)
• Electronic structure at realistic Si(100)-SiO2 interfaces
  per: Giustino, F, et al.
  Publicat: (2004)