Controlling sulphur precursor addition for large single crystal domains of WS2.

We show that controlling the introduction time and the amount of sulphur (S) vapour relative to the WO3 precursor during the chemical vapour deposition (CVD) growth of WS2 is critical to achieving large crystal domains on the surface of silicon wafers with a 300 nm oxide layer. We use a two furnace...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Rong, Y, Fan, Y, Leen Koh, A, Robertson, A, He, K, Wang, S, Tan, H, Sinclair, R, Warner, J
Μορφή: Journal article
Γλώσσα:English
Έκδοση: Royal Society of Chemistry 2014