Aberration-corrected imaging of active sites on industrial catalyst nanoparticles.

Aberration-corrected imaging of active sites on industrial catalyst nanoparticles.

Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM tech...

وصف كامل

التفاصيل البيبلوغرافية
المؤلفون الرئيسيون: Gontard, L, Chang, L, Hetherington, C, Kirkland, A, Ozkaya, D, Dunin-Borkowski, R
التنسيق: Journal article
اللغة:English
منشور في: 2007
الوصف
الملخص:Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM techniques based on recent developments in hardware (aberration correction) and computation (exit wavefunction restoration). (Figure Presented). © 2007 Wiley-VCH Verlag GmbH and Co. KGaA.

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