Aberration-corrected imaging of active sites on industrial catalyst nanoparticles.
Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM tech...
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Bibliographic Details
| Main Authors: |
Gontard, L,
Chang, L,
Hetherington, C,
Kirkland, A,
Ozkaya, D,
Dunin-Borkowski, R |
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| Format: | Journal article
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| Language: | English |
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| Published: |
2007
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