Aberration-corrected imaging of active sites on industrial catalyst nanoparticles.

Aberration-corrected imaging of active sites on industrial catalyst nanoparticles.

Picture perfect: Information about the local topologies of active sites on commercial nanoparticles can be gained with atomic resolution through spherical-aberration-corrected transmission electron microscopy (TEM). A powder of Pt nanoparticles on carbon black was examined with two advanced TEM tech...

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Bibliographic Details
Main Authors:	Gontard, L, Chang, L, Hetherington, C, Kirkland, A, Ozkaya, D, Dunin-Borkowski, R
Format:	Journal article
Language:	English
Published:	2007

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