Element specific atom counting at the atomic scale by combining high angle annular dark field scanning transmission electron microscopy and energy dispersive X-ray spectroscopy

Element specific atom counting at the atomic scale by combining high angle annular dark field scanning transmission electron microscopy and energy dispersive X-ray spectroscopy

A new methodology is presented to count the number of atoms in multimetallic nanocrystals by combining energy dispersive X-ray spectroscopy (EDX) and high angle annular dark field scanning transmission electron microscopy (HAADF STEM). For this purpose, the existence of a linear relationship between...

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Bibliographic Details
Main Authors:	De Backer, A, Zhang, Z, van den Bos, KHW, Bladt, E, Sánchez-Iglesias, A, Liz-Marzán, LM, Nellist, PD, Bals, S, Van Aert, S
Format:	Journal article
Language:	English
Published:	Wiley 2022

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