Mass-resolved ion microscope imaging over expanded mass ranges using double-field post-extraction differential acceleration
A modified post-extraction differential acceleration (PEDA) technique employing two pulsed electrodes was used to demonstrate mass-resolved stigmatic imaging over a broad m/z range. By varying the pulse voltages, a potential energy cusp was introduced into the ion acceleration region of an imaging m...
| Main Authors: | , , |
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| Format: | Journal article |
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Elsevier
2017
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| _version_ | 1826272347014823936 |
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| author | Guo, A Burt, M Brouard, M |
| author_facet | Guo, A Burt, M Brouard, M |
| author_sort | Guo, A |
| collection | OXFORD |
| description | A modified post-extraction differential acceleration (PEDA) technique employing two pulsed electrodes was used to demonstrate mass-resolved stigmatic imaging over a broad m/z range. By varying the pulse voltages, a potential energy cusp was introduced into the ion acceleration region of an imaging mass spectrometer, creating two m/z foci that were tuned to overlap at the detector plane. This resulted in two focused m/z distributions that stretched the mass-resolved window with m/Δm ≥ 1000 to 165 Da without any loss in image quality; a range that doubled the 65 Da achieved under similar conditions using the original PEDA technique. |
| first_indexed | 2024-03-06T22:11:07Z |
| format | Journal article |
| id | oxford-uuid:51d7987d-f3db-4c6a-bf05-f5904c2f882f |
| institution | University of Oxford |
| last_indexed | 2024-03-06T22:11:07Z |
| publishDate | 2017 |
| publisher | Elsevier |
| record_format | dspace |
| spelling | oxford-uuid:51d7987d-f3db-4c6a-bf05-f5904c2f882f2022-03-26T16:21:59ZMass-resolved ion microscope imaging over expanded mass ranges using double-field post-extraction differential accelerationJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:51d7987d-f3db-4c6a-bf05-f5904c2f882fSymplectic Elements at OxfordElsevier2017Guo, ABurt, MBrouard, MA modified post-extraction differential acceleration (PEDA) technique employing two pulsed electrodes was used to demonstrate mass-resolved stigmatic imaging over a broad m/z range. By varying the pulse voltages, a potential energy cusp was introduced into the ion acceleration region of an imaging mass spectrometer, creating two m/z foci that were tuned to overlap at the detector plane. This resulted in two focused m/z distributions that stretched the mass-resolved window with m/Δm ≥ 1000 to 165 Da without any loss in image quality; a range that doubled the 65 Da achieved under similar conditions using the original PEDA technique. |
| spellingShingle | Guo, A Burt, M Brouard, M Mass-resolved ion microscope imaging over expanded mass ranges using double-field post-extraction differential acceleration |
| title | Mass-resolved ion microscope imaging over expanded mass ranges using double-field post-extraction differential acceleration |
| title_full | Mass-resolved ion microscope imaging over expanded mass ranges using double-field post-extraction differential acceleration |
| title_fullStr | Mass-resolved ion microscope imaging over expanded mass ranges using double-field post-extraction differential acceleration |
| title_full_unstemmed | Mass-resolved ion microscope imaging over expanded mass ranges using double-field post-extraction differential acceleration |
| title_short | Mass-resolved ion microscope imaging over expanded mass ranges using double-field post-extraction differential acceleration |
| title_sort | mass resolved ion microscope imaging over expanded mass ranges using double field post extraction differential acceleration |
| work_keys_str_mv | AT guoa massresolvedionmicroscopeimagingoverexpandedmassrangesusingdoublefieldpostextractiondifferentialacceleration AT burtm massresolvedionmicroscopeimagingoverexpandedmassrangesusingdoublefieldpostextractiondifferentialacceleration AT brouardm massresolvedionmicroscopeimagingoverexpandedmassrangesusingdoublefieldpostextractiondifferentialacceleration |