APA (7th ed.) Citation

Van Aert, S., De Backer, A., Jones, L., Martinez, G., Béché, A., & Nellist, P. (2019). Control of knock-on damage for 3D atomic scale quantification of nanostructures: Making every electron count in scanning transmission electron microscopy. American Physical Society.

Chicago Style (17th ed.) Citation

Van Aert, S., A. De Backer, L. Jones, G. Martinez, A. Béché, and P. Nellist. Control of Knock-on Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy. American Physical Society, 2019.

MLA (9th ed.) Citation

Van Aert, S., et al. Control of Knock-on Damage for 3D Atomic Scale Quantification of Nanostructures: Making Every Electron Count in Scanning Transmission Electron Microscopy. American Physical Society, 2019.