Control of knock-on damage for 3D atomic scale quantification of nanostructures: Making every electron count in scanning transmission electron microscopy
Understanding nanostructures down to the atomic level is the key to optimizing the design of advanced materials with revolutionary novel properties. This requires characterization methods capable of quantifying the three-dimensional (3D) atomic structure with the highest possible precision. A succes...
| Hoofdauteurs: | , , , , , |
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| Formaat: | Journal article |
| Gepubliceerd in: |
American Physical Society
2019
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