Electron diffraction from nanovolumes of amorphous material using coherent convergent illumination.
Using a conventional transmission electron microscope that incorporates a field emission gun it is possible to focus an electron beam to form a small probe (<1nm full-width at half-maximum). Such a probe can then be used to perform high spatial resolution diffraction experiments. The high spa...
Glavni autori: | McBride, W, Cockayne, D, Nguyen-Manh, D |
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Format: | Journal article |
Jezik: | English |
Izdano: |
2003
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Slični predmeti
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The structure of nanovolumes of amorphous materials
od: McBride, W, i dr.
Izdano: (2003) -
Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam.
od: McBride, W, i dr.
Izdano: (2003) -
Characterization of Amorphous Materials by Electron Diffraction and Atomistic Modeling.
od: Cockayne, D, i dr.
Izdano: (2000) -
Reduced density function analysis using convergent electron illumination and iterative blind deconvolution
od: McBride, W, i dr.
Izdano: (1999) -
Electron diffraction studies of the structure of amorphous and polycrystalline materials
od: Cockayne, D, i dr.
Izdano: (1998)