$Electron diffraction from nanovolumes of amorphous material using coherent convergent illumination.$

Electron diffraction from nanovolumes of amorphous material using coherent convergent illumination.

Using a conventional transmission electron microscope that incorporates a field emission gun it is possible to focus an electron beam to form a small probe (<1nm full-width at half-maximum). Such a probe can then be used to perform high spatial resolution diffraction experiments. The high spa...

Disgrifiad llawn

Manylion Llyfryddiaeth
Prif Awduron:	McBride, W, Cockayne, D, Nguyen-Manh, D
Fformat:	Journal article
Iaith:	English
Cyhoeddwyd:	2003

Eitemau Tebyg

The structure of nanovolumes of amorphous materials
gan: McBride, W, et al.
Cyhoeddwyd: (2003)

Deconvolution of electron diffraction patterns of amorphous materials formed with convergent beam.
gan: McBride, W, et al.
Cyhoeddwyd: (2003)

Characterization of Amorphous Materials by Electron Diffraction and Atomistic Modeling.
gan: Cockayne, D, et al.
Cyhoeddwyd: (2000)

Reduced density function analysis using convergent electron illumination and iterative blind deconvolution
gan: McBride, W, et al.
Cyhoeddwyd: (1999)

Nanoscale structural analysis of amorphous materials
gan: McBride, W, et al.
Cyhoeddwyd: (2001)

Electron diffraction studies of the structure of amorphous and polycrystalline materials
gan: Cockayne, D, et al.
Cyhoeddwyd: (1998)

Dark field microscopy for diffraction analysis of amorphous carbon solids
gan: McBride, W, et al.
Cyhoeddwyd: (2005)

Refinement of amorphous and polycrystalline structures of thin disordered films using energy selected electron diffraction
gan: Cockayne, D, et al.
Cyhoeddwyd: (1998)

ELECTRON-DIFFRACTION ANALYSIS OF POLYCRYSTALLINE AND AMORPHOUS THIN-FILMS
gan: Cockayne, D, et al.
Cyhoeddwyd: (1988)

ELECTRON-DIFFRACTION ANALYSIS OF POLYCRYSTALLINE AND AMORPHOUS THIN-FILMS
gan: Cockayne, D, et al.
Cyhoeddwyd: (1988)

ELECTRON-DIFFRACTION ANALYSIS OF POLYCRYSTALLINE AND AMORPHOUS THIN-FILMS
gan: Cockayne, D, et al.
Cyhoeddwyd: (1988)

Radial distribution function analysis of the amorphous barrier layer in magnetic spin tunnel junctions
gan: Ozkaya, D, et al.
Cyhoeddwyd: (2004)

Low‐coherent optical diffraction tomography by angle‐scanning illumination
gan: Lee, KyeoReh, et al.
Cyhoeddwyd: (2021)

ELECTRON-DIFFRACTION STUDY OF THE STRUCTURE OF BORON-DOPED AND PHOSPHORUS-DOPED HYDROGENATED AMORPHOUS-SILICON
gan: Liu, Z, et al.
Cyhoeddwyd: (1988)

Convergent beam and 2 dimensional energy filtered RDF analysis
gan: McBride, W, et al.
Cyhoeddwyd: (1998)

X-ray diffraction procedures for polycrystalline and amorphous materials/
gan: 205940 Klug, Harold Phillip, et al.
Cyhoeddwyd: (1974)

Common-path diffraction optical tomography with a low-coherence illumination for reducing speckle noise
gan: Park, HyunJoo, et al.
Cyhoeddwyd: (2015)

SIGN CONVENTIONS IN ELECTRON-DIFFRACTION AND IMAGING
gan: Saxton, W, et al.
Cyhoeddwyd: (1984)

Modeling In-Se amorphous alloys
gan: Kohary, K, et al.
Cyhoeddwyd: (2005)

Modeling In-Se amorphous alloys
gan: Kohary, K, et al.
Cyhoeddwyd: (2005)

Coherent diffraction imaging
gan: Muhammad Khairul Ismail
Cyhoeddwyd: (2016)

Diffraction: coherence in optics/
gan: 281353 Francon, Maurice
Cyhoeddwyd: (1966)

ELECTRON IMAGING AND ENERGY-LOSS STUDIES OF THE CRYSTALLIZATION OF HYDROGENATED AMORPHOUS-SILICON
gan: Mckenzie, D, et al.
Cyhoeddwyd: (1986)

Structural modelling of nano-amorphous Si-O-N films in silicon nitride ceramics
gan: Nguyen-Manh, D, et al.
Cyhoeddwyd: (2004)

Refinements for Bragg coherent X-ray diffraction imaging: electron backscatter diffraction alignment and strain field computation
gan: Yang, D, et al.
Cyhoeddwyd: (2022)

Accessing the diffracted wavefield by coherent subtraction
gan: Schwarz, B, et al.
Cyhoeddwyd: (2017)

Nanomodulated electron beams via electron diffraction and emittance exchange for coherent x-ray generation
gan: Graves, W. S., et al.
Cyhoeddwyd: (2018)

Quantum illumination versus coherent-state target detection
gan: Shapiro, Jeffrey H., et al.
Cyhoeddwyd: (2012)

Simulated electron energy loss spectra from a C70 crystal.
gan: Nicholls, R, et al.
Cyhoeddwyd: (2006)

[001] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(001).
gan: Liao, X, et al.
Cyhoeddwyd: (2004)

THE DETERMINATION OF COORDINATION NUMBERS FOR BINARY-ALLOYS USING ENERGY-SELECTED ELECTRON-DIFFRACTION
gan: Hall, L, et al.
Cyhoeddwyd: (1993)

Single-frame far-field diffractive imaging with randomized illumination
gan: Levitan, Abraham, et al.
Cyhoeddwyd: (2020)

Coherent wavefield subtraction for diffraction separation
gan: Schwarz, B
Cyhoeddwyd: (2019)

X-ray diffraction in crystals, imperfect crystals and amorphous bodies/
gan: 241542 Guinier, Andre
Cyhoeddwyd: (1963)

Glasses and amorphous materials /
gan: Zarzycki, J.
Cyhoeddwyd: (1991)

Physics of amorphous materials /
gan: Elliott, S. R. (Stephen Richard), 1952-
Cyhoeddwyd: (1983)

Toward electron exit wave tomography of amorphous materials at atomic resolution
gan: Borisenko, K, et al.
Cyhoeddwyd: (2012)

Toward electron exit wave tomography of amorphous materials at atomic resolution
gan: Borisenko, K, et al.
Cyhoeddwyd: (2012)

DESIGN AND OPERATION OF AN ELECTRON DIFFRACTION CAMERA FOR STUDY OF SMALL CRYSTALLINE REGIONS
gan: Cockayne, D, et al.
Cyhoeddwyd: (1967)

Structural determination of materials using electron diffraction
gan: Kho, Eric
Cyhoeddwyd: (2021)