Surface investigation of a cubic AIN buffer layer and GaN grown on Si (111) and si (100) as revealed by atomic force microscopy
| Main Authors: | , , , , , , , |
|---|---|
| Format: | Journal article |
| Published: |
2006
|
| _version_ | 1797069650445467648 |
|---|---|
| author | Bae, M Shin, D Yi, SN Na, J Green, A Taylor, R Park, S Kang, N |
| author_facet | Bae, M Shin, D Yi, SN Na, J Green, A Taylor, R Park, S Kang, N |
| author_sort | Bae, M |
| collection | OXFORD |
| description | |
| first_indexed | 2024-03-06T22:27:36Z |
| format | Journal article |
| id | oxford-uuid:572f7585-b1cd-485c-b4e3-3db562defbc4 |
| institution | University of Oxford |
| last_indexed | 2024-03-06T22:27:36Z |
| publishDate | 2006 |
| record_format | dspace |
| spelling | oxford-uuid:572f7585-b1cd-485c-b4e3-3db562defbc42022-03-26T16:55:07ZSurface investigation of a cubic AIN buffer layer and GaN grown on Si (111) and si (100) as revealed by atomic force microscopyJournal articlehttp://purl.org/coar/resource_type/c_dcae04bcuuid:572f7585-b1cd-485c-b4e3-3db562defbc4Symplectic Elements at Oxford2006Bae, MShin, DYi, SNNa, JGreen, ATaylor, RPark, SKang, N |
| spellingShingle | Bae, M Shin, D Yi, SN Na, J Green, A Taylor, R Park, S Kang, N Surface investigation of a cubic AIN buffer layer and GaN grown on Si (111) and si (100) as revealed by atomic force microscopy |
| title | Surface investigation of a cubic AIN buffer layer and GaN grown on Si (111) and si (100) as revealed by atomic force microscopy |
| title_full | Surface investigation of a cubic AIN buffer layer and GaN grown on Si (111) and si (100) as revealed by atomic force microscopy |
| title_fullStr | Surface investigation of a cubic AIN buffer layer and GaN grown on Si (111) and si (100) as revealed by atomic force microscopy |
| title_full_unstemmed | Surface investigation of a cubic AIN buffer layer and GaN grown on Si (111) and si (100) as revealed by atomic force microscopy |
| title_short | Surface investigation of a cubic AIN buffer layer and GaN grown on Si (111) and si (100) as revealed by atomic force microscopy |
| title_sort | surface investigation of a cubic ain buffer layer and gan grown on si 111 and si 100 as revealed by atomic force microscopy |
| work_keys_str_mv | AT baem surfaceinvestigationofacubicainbufferlayerandgangrownonsi111andsi100asrevealedbyatomicforcemicroscopy AT shind surfaceinvestigationofacubicainbufferlayerandgangrownonsi111andsi100asrevealedbyatomicforcemicroscopy AT yisn surfaceinvestigationofacubicainbufferlayerandgangrownonsi111andsi100asrevealedbyatomicforcemicroscopy AT naj surfaceinvestigationofacubicainbufferlayerandgangrownonsi111andsi100asrevealedbyatomicforcemicroscopy AT greena surfaceinvestigationofacubicainbufferlayerandgangrownonsi111andsi100asrevealedbyatomicforcemicroscopy AT taylorr surfaceinvestigationofacubicainbufferlayerandgangrownonsi111andsi100asrevealedbyatomicforcemicroscopy AT parks surfaceinvestigationofacubicainbufferlayerandgangrownonsi111andsi100asrevealedbyatomicforcemicroscopy AT kangn surfaceinvestigationofacubicainbufferlayerandgangrownonsi111andsi100asrevealedbyatomicforcemicroscopy |