Testing the accuracy of the two-dimensional object model in HAADF STEM.
In high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) the two-dimensional (2D) object-function approximation and image convolution model is often used to describe the recorded image data from on-axis crystalline samples. In this model the sample, represented by an o...
| Հիմնական հեղինակներ: | , |
|---|---|
| Ձևաչափ: | Journal article |
| Լեզու: | English |
| Հրապարակվել է: |
2014
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