Secondary electron emission contrast of quantum wells in GaAs p-i-n junctions.
The secondary electron (SE) signal over a cleaved surface of GaAs p-i-n solar cells containing stacks of quantum wells (QWs) is analyzed by high-resolution scanning electron microscopy. The InGaAs QWs appear darker than the GaAsP barriers, which is attributed to the differences in electron affinity....
Main Authors: | Grunbaum, E, Barkay, Z, Shapira, Y, Barnham, K, Bushnell, D, Ekins-Daukes, N, Mazzer, M, Wilshaw, P |
---|---|
Format: | Journal article |
Language: | English |
Published: |
2009
|
Similar Items
-
High-resolution scanning electron microscopy of dopants in p-i-n junctions with quantum wells
by: Barkay, Z, et al.
Published: (2004) -
The electric field and dopant distribution in p-i-n structures observed by ionisation potential (dopant contrast) microscopy in the HRSEM
by: Grunbaum, E, et al.
Published: (2005) -
Quantum well intermixing in GaInNAs/GaAs structures
by: Sun, Handong, et al.
Published: (2009) -
Design of GaAsNBi/GaAs quantum well laser with emission wavelength of 1.55um
by: Chen, Ruiming
Published: (2017) -
Magneto-photoluminescence study of InGaAs/GaAs quantum wells and quantum dots grown on (111)B GaAs substrate
by: Tyan, S, et al.
Published: (2000)