Characterization of Polycrystalline Materials Using Synchrotron X-ray Imaging and Diffraction Techniques
The combination of synchrotron radiation x-ray imaging and diffraction techniques offers new possibilities for in-situ observation of deformation and damage mechanisms in the bulk of polycrystalline materials. Minute changes in electron density (i.e., cracks, porosities) can be detected using propag...
| المؤلفون الرئيسيون: | , , , , , , , , |
|---|---|
| التنسيق: | Journal article |
| اللغة: | English |
| منشور في: |
2010
|