STATISTICAL-ANALYSIS OF ATOM PROBE DATA

STATISTICAL-ANALYSIS OF ATOM PROBE DATA

Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	Hetherington, M, Cerezo, A, Hyde, J, Smith, G, Worrall, G
Formáid:	Journal article
Teanga:	English
Foilsithe / Cruthaithe:	1986

Míreanna comhchosúla

STRUCTURAL-ANALYSIS WITH THE POSITION-SENSITIVE ATOM PROBE
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VISUALIZATION AND ANALYSIS OF 3-DIMENSIONAL ATOM PROBE DATA
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MATERIALS ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
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ANALYSIS OF DATA FROM AN OPTICAL ATOM-PROBE
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Statistical analysis of atom probe data: detecting the early stages of solute clustering and/or co-segregation.
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NEW DIMENSIONS IN ATOM-PROBE ANALYSIS
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QUANTITATIVE ATOM PROBE ANALYSIS OF SPINODAL REACTION IN FERRITE PHASE OF DUPLEX STAINLESS-STEEL
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IMPROVEMENTS IN 3-DIMENSIONAL ATOM-PROBE DESIGN
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ANALYSIS OF NANOMETER-SIZED PRECIPITATES USING ATOM PROBE TECHNIQUES
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Some recent advances in three dimensional atomic scale microanalysis with the atom probe (invited)
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ATOM PROBE ANALYSIS AND MODELING OF INTERFACES IN MAGNETIC MULTILAYERS
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ATOM PROBE CHARACTERIZATION OF CO TRANSITION-METAL MULTILAYER STRUCTURES
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RECENT DEVELOPMENTS IN POSITION-SENSITIVE ATOM-PROBE MICROANALYSIS
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LATERAL AND DEPTH SCALE CALIBRATION OF THE POSITION-SENSITIVE ATOM-PROBE
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Progress in the atomic-scale analysis of materials with the three-dimensional atom probe
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RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
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RECENT DEVELOPMENTS IN ATOM PROBE MICROANALYSIS OF MATERIALS WITH ULTRAFINE MICROSTRUCTURES
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ULTRA-HIGH-RESOLUTION CHEMICAL-ANALYSIS BY FIELD-ION MICROSCOPY, ATOM PROBE AND POSITION-SENSITIVE ATOM-PROBE TECHNIQUES
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PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
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PULSED LASER ATOM PROBE ANALYSIS OF GAAS AND INAS
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PULSED LASER ATOM PROBE ANALYSIS OF SEMICONDUCTOR-MATERIALS
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Detecting clusters in atom probe data with Gaussian mixture models.
de réir: Zelenty, J, et al.
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SURFACE-ANALYSIS WITH A POSITION-SENSITIVE ATOM PROBE
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THE POSITION-SENSITIVE ATOM PROBE - RECONSTRUCTION OF THE ATOMIC CHEMISTRY OF SOLIDS IN 3-DIMENSIONS (SUMMARY)
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POSITION-SENSITIVE ATOM-PROBE STUDY OF THE DECOMPOSITION OF A CU-2.6AT-PERCENT-CO ALLOY
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ATOM PROBE ANALYSIS OF A CERAMIC OXIDE SUPERCONDUCTOR
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A UK Facility for Atom Probe Tomography Analysis
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AN FIM-ATOM PROBE AND TEM STUDY OF ALNICO PERMANENT MAGNETIC MATERIAL
de réir: Cowley, S, et al.
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PULSED LASER ATOM PROBE ANALYSIS OF III-V COMPOUND SEMICONDUCTORS
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IMPROVEMENTS IN THE TRANSMISSION OF VOLTAGE EVAPORATION PULSES IN THE ATOM-PROBE
de réir: Sijbrandij, S, et al.
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Studies of boundaries and interfaces on the atomic scale by atom probe FIM
de réir: Smith, G, et al.
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AN ELECTRONIC AND COMPUTER-SYSTEM FOR AN AUTOMATED ATOM PROBE
de réir: Cerezo, A, et al.
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SPINODAL DECOMPOSITION IN FE-CR ALLOYS - EXPERIMENTAL-STUDY AT THE ATOMIC-LEVEL AND COMPARISON WITH COMPUTER-MODELS .1. INTRODUCTION AND METHODOLOGY
de réir: Miller, M, et al.
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SPINODAL DECOMPOSITION IN FE-CR ALLOYS - EXPERIMENTAL-STUDY AT THE ATOMIC-LEVEL AND COMPARISON WITH COMPUTER-MODELS .3. DEVELOPMENT OF MORPHOLOGY
de réir: Hyde, J, et al.
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RECENT DEVELOPMENTS IN THE STUDY OF SEMICONDUCTORS BY ATOM PROBE MICROANALYSIS.
de réir: Grovenor, C, et al.
Foilsithe / Cruthaithe: (1985)

Improvements in the mass resolution of the three-dimensional atom probe
de réir: Sijbrandij, S, et al.
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DEVELOPMENT AND INITIAL APPLICATIONS OF A POSITION-SENSITIVE ATOM PROBE
de réir: Cerezo, A, et al.
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APPLICATION OF A POSITION-SENSITIVE DETECTOR TO ATOM PROBE MICROANALYSIS
de réir: Cerezo, A, et al.
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SPINODAL DECOMPOSITION IN FE-CR ALLOYS - EXPERIMENTAL-STUDY AT THE ATOMIC-LEVEL AND COMPARISON WITH COMPUTER-MODELS .2. DEVELOPMENT OF DOMAIN SIZE AND COMPOSITION AMPLITUDE
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THE FIM100 - PERFORMANCE OF A COMMERCIAL ATOM PROBE SYSTEM
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